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Pittcon®2009


The premier conference and exposition on laboratory sciences celebrates 60 years of service to the scientific community. Pittcon is the most comprehensive annual meeting on laboratory science in the world, offering a first class lab product exposition, a diverse, high quality technical program, unparalleled educational programs, and invaluable peer to peer networking opportunities.

NETZSCH presents the DSC 200 F3 Maia ®, the newest Differential Scanning Calorimeter development at NETZSCH unites compactness, robustness and simple operation with high detection sensitivity for your preferred application in material quality control and failure analysis, especially in polymer processing.

Further on display will be the TG 209 F3 Tarus , an easy-to-use thermo-microbalance that was developed especially for routine applications in the field of plastics, but also for the chemical industry. It is the ideal starter unit up to 1000°C and, together with the DSC 200 F3 Maia®, represents a cost-effective overall concept.

Do not miss the chance to explore our new STA 449 F3 Jupiter ®, that combines the advantages of a high sensitive thermobalance and a true Differential Scanning Calorimeter. Various furnaces and TG, TG-DTA- and TG-DSC-sensors can be used, whereby the system can be easily optimized for the most versatile applications.
During the exhibition it will be equipped with our QMS 403 Aëolos ®.
The QMS 403 Aëolos® is a very compact mass spectrometer with a heated capillary inlet system, specially designed for routine analysis of volatile decomposition products of thermal analysis.

We also have on showcase the LFA 457 MicroFlash ®. It is the most modern product for the determination of thermal diffusivity and conductivity in the range from -125°C to 1100°C. Its compact, vacuum-tight construction, automatic sample changer and functional software guarantee the highest effectiveness for challenging materials testing.



Our US-American subsidiary company, NETZSCH Instruments, Inc., is looking forward to your visit.


 
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