Thermal diffusivity measurements - made easy

LFA 447 NanoFlash® - Xenon Flash Apparatus

 

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LFA 447 NanoFlash® - Technical Specifications (subject to change)

• Temperature range: RT ... 300°C

• Xenon-Flash-Lamp 10 J/pulse, (adjustable power)

• Contactless measurement of temperature rise with IR detector

• Measuring range: 0.01 mm2/s ... 1000 mm2/s (thermal diffusivity)

• Measuring range: < 0.1 W/mK ... 2000 W/mK (thermal conductivity)

• Sample dimensions: 10 mm ... 25.4 mm diameter (also 8x8 mm and 10x10 mm, square) 0.1 mm ... 3 mm thickness

• Sample support for 4 samples

• Sample holder: metal

• Sample holder for liquids: aluminum / platinum

• Atmospheres: air, static

• MTX Scanning device for 50 mm x 50 mm samples (RT), local resolution 0.1 mm

Schematic of LFA 447 NanoFlash®

Please also visit the following product pages:

LFA 427

LFA 457 MicroFlash®