Thermal diffusivity measurements - made easy

LFA 447 NanoFlash® - Xenon Flash Apparatus

 

General

Technique

Software

Applications

Accessories

Literature

• NEW: The fifth generation of the Proteus® measurement and analysis

software has been released.

The LFA 447NanoFlash® runs under Proteus® Software on Windows®. The Proteus® Software includes everything you need to carry out a measurement and evaluate the resulting data. Through the combination of easy-to-understand menus and automated routines, a tool has been created that is extremely user-friendly and, at the same time, allows sophisticated analysis. The Proteus® software is licensed with the instrument and can of course be installed on other computer systems.

LFA features:

• Accurate pulse length correction

• Heat-loss corrections, all literature models are integrated

• Non-linear regression for Cowan fit

• Improved Cape-Lehmann model through consideration of multi-dimensional heat loss and non-linear regression

• Radiation correction for semi-transparent samples

• 2- or 3-layers systems: analysis by means of non-linear regression and consideration of heat loss

• Determination of contact resistance in multi-layer systems

• Model wizard for selecting the optimum evaluation model

• Determination of specific heat by means of a comparative method and standard samples

• Integrated databank

You can use the following software with this product:

Proteus® Software

 

General

Technique

Software

Applications

Accessories

Literature

Please also visit the following product pages:

LFA 427

LFA 457 MicroFlash®