Webinar Series:
Time Domain Thermoreflectance Methods using the NETZSCH Nano/PicoTR Instruments

With Dr. Tony Thermitus, President, NETZSCH Instruments North America LLC


Basic Theory and Data Analysis of Time Domain Thermoreflectance Methods for Nanometer-thin Films using the NETZSCH Nano/PicoTR Instruments

November 17, 2021 | 3 PM EDT / 9 PM CET

The Time Domain Thermoreflectance method is the technique of choice when it comes to measuring the thermophysical properties of thin film specimens. Contrary to the conventional Light Flash Method (LFA), this method involves a series of consecutive flash pulses, and the detector signal is obtained by means of the thermoreflectance properties of a known reflective layer. 

In this webinar, Dr. Tony Thermitus will introduce the basics of data analysis for the determination of thermal diffusivity in the nanometer thickness range with the Nano/PicoTR instruments.

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Time Domain Thermoreflectance Methods for Nanometer-thin Films using the NETZSCH Nano/PicoTR Instruments

November 30, 2021 | 10 AM EDT / 4 PM CET

With the significant progress in the design of electronic devices and the associated need for efficient thermal management, accurate thermal diffusivity / thermal conductivity measurements in the nanometer range are crucial. Materials with such thicknesses are used in phase-change memories (PCM), thermoelectric thin films, light emitting diodes (LED), interlayer dielectrics, and transparent conductive films (FPD), etc. The thicknesses of nanometer-thin films are often less than the typical grain size. Consequently, their thermophysical properties differ significantly from the bulk material.  

In this webinar, Dr. Tony Thermitus will introduce the basics of Time Domain Thermoreflectance Methods.  He will cover the general instrument set-up for measurement of nanometer-thin films. Following this, he will demonstrate the basics of data analysis for the determination of thermal diffusivity in the nanometer thickness range.  

Learn more & register for free!