BCEIA – The 18th Beijing Conference and Exhibition on Instrumental Analysis

Sponsored by CAIA (China Association for Instrumental Analysis), the Beijing Conference and Exhibition on Instrumental Analysis (BCEIA) is a highly specialized and well respected international analytical instruments conference and exhibition in China.

Serving as a platform for demonstrating new technology, new instruments and new equipment, BCEIA Exhibition has always attracted global interest from experts, scholars and science and technology personnel.

Venue:

China National Convention Center (CNCC)
No.7 Tianchen East Road
Chaoyang District
Beijing 100105
China

NETZSCH is going to feature the following product solutions at booth #41088:

STA 449 F3 Jupiter®

The STA 449 F3 Jupiter® combines the advantages of a high sensitive thermobalance and a true Differential Scanning Calorimeter. Various furnaces and TG, TGA-DTA and TGA-DSC sensors can be used, whereby the system can be easily optimized for the most versatile applications.

DIL 402 Expedis Select & Supreme

The new dilatometer DIL 402 Expedis Select and Supreme offer state-of-the-art dilatometer technology and are designed for a wide range of sophisticated applications. All instruments of the DIL Expedis series feature the revolutionary NanoEye measuring cell; a new dimension in measuring range and accuracy.

LFA 467 HyperFlash® – Light Flash Apparatus

The new LFA 467 HyperFlash® features a wide temperature range, very high efficiency (with its sample changer for 16 samples), extremely fast data acquisition rates and an intelligent lens system (ZoomOptics) between the sample and detector.

DSC 214 Polyma
  • High Performance
  • Smart Measurement
  • AutoEvaluation
  • Innovative Identification
  • Easy Sample Preparation
  • Unique Concavus® Pan