Silicon wafer — Thermophysical Properties

In this example, the thermophysical properties of a silicon wafer were measured with the LFA 457 MicroFlash®. In the temperature range from -100°C to 500°C, the thermal conductivity and thermal diffusivity continuously decrease.
Determination of the specific heat was carried out with the DSC 204 F1 Phoenix®. The standard deviation of the data points is < 1%.

LFA and DSC measurement of a silicon wafer between -100°C and 500°C.LFA and DSC measurement of a silicon wafer between -100°C and 500°C.
DSC 204 F1 Phoenix®

Bu yüksek kaliteli Diferansiyel Taramalı Kalorimetre (DSC) cihazı ile yüksek hassasiyet ve çözünürlük elde edilebilmektedir. Bunun yanında otomatik numune değiştirici (ASC), sıcaklık modülasyonu (TM-DSC), baseline optimizasyonu (BeFlat®), termal direnç ve zaman sabiti doğrulaması (DSC-Correction) ve hatta QMS (Quadruple Mass Spectrometre) ve FT-IR (Fourier Transform Infrared Spectroemtre) cihazlarına bağlantı ve fotokalorimetre için UV eklentisi gibi özellikleri de bulunmaktadır.

LFA 457 MicroFlash® - Laser Flash Apparatus

The LFA 457 MicroFlash® is the most modern product for the determination of the two thermophysical properties, thermal diffusivity and conductivity, in the range from -125°C to 1100°C. Its compact, vacuum-tight construction, automatic sample changer and functional software guarantee the highest effectiveness for challenging materials testing.